Availability: | |
---|---|
Quantity: | |
Instrument overview
It is suitable for electronic connectors, semiconductor ICs, transistors, diodes, liquid crystal LCDs, chip resistors, capacitors, and components of electronic components before the aging accelerated life time test before the tinning test of metal pins; Oxidation test of semiconductors, passive components, and parts pins. Microcomputer temperature controller, LED digital display, PID+SSR control, platinum resistive temperature sensor (PT-100), resolution 0.1°C, fully automatic safety protection device.
Model specifications | LG-5027 |
Inner box size (W×H×D) mm: | 500×400×200 |
Carton size (W×H×D) mm: | 600×500×420 |
Steam temperature (°C): | Upto97°C |
Controller PID microcomputer temperature control heating method: | PID+SCR |
Heating time: | about 45 minutes control accuracy ±0.5°C |
Timer: | 9999 min voltage 220V power 2KW |
Instrument overview
It is suitable for electronic connectors, semiconductor ICs, transistors, diodes, liquid crystal LCDs, chip resistors, capacitors, and components of electronic components before the aging accelerated life time test before the tinning test of metal pins; Oxidation test of semiconductors, passive components, and parts pins. Microcomputer temperature controller, LED digital display, PID+SSR control, platinum resistive temperature sensor (PT-100), resolution 0.1°C, fully automatic safety protection device.
Model specifications | LG-5027 |
Inner box size (W×H×D) mm: | 500×400×200 |
Carton size (W×H×D) mm: | 600×500×420 |
Steam temperature (°C): | Upto97°C |
Controller PID microcomputer temperature control heating method: | PID+SCR |
Heating time: | about 45 minutes control accuracy ±0.5°C |
Timer: | 9999 min voltage 220V power 2KW |